Noise in Semiconductor Devices

Modeling and Simulation

Fabrizio Bonani, Giovanni Ghione (Autoren)

Buch | Hardcover

XXXI, 213 Seiten

2001 | 2001
Springer Berlin (Verlag)
978-3-540-66583-0 (ISBN)

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The design and optimization of electronic systems often requires appraisal an of the electrical noise generated by active devices, and, at a technological level, the ability to properly design active elements in order to minimize, when possible, their noise. Examples of critical applications are, of course, receiver front-ends in RF and optoelectronic transmission systems, but also front-end stages in sensors and, in a completely different context, nonlinear circuits such as oscillators, mixers, and frequency multipliers. The rapid de velopment of silicon RF applications has recently fostered the interest toward low-noise silicon devices for the lower microwave band, such as low-noise MOS transistors; at the same time, the RF and microwave ranges are be coming increasingly important in fast optical communication systems. Thus, high-frequency noise modeling and simulation of both silicon and compound semiconductor based bipolar and field-effect transistors can be considered as an important and timely topic. This does not exclude, of course, low frequency noise, which is relevant also in the RF and microwave ranges when ever it is up-converted within a nonlinear system, either autonomous (as an oscillator) or non-autonomous (as a mixer or frequency multiplier). The aim of the present book is to provide a thorough introduction to the physics-based numerical modeling of semiconductor devices operating both in small-signal and in large-signal conditions. In the latter instance, only the non-autonomous case was considered, and thus the present treatment does not directly extend to oscillators.

1. Noise in Semiconductor Devices.- 2. Noise Analysis Techniques.- 3. Physics-Based Small-Signal Noise Simulation.- 4. Results and Case Studies.- 5. Noise in Large-Signal Operation.- A. Appendix: Review of Probability Theory and Random Processes.- A.1 Fundamentals of Probability Theory.- A.2 Random Processes.- A.3 Correlation Spectra and Generalized Harmonic Analysis of Stochastic Processes.- A.4 Linear Transformations of Stochastic Processes.- A.5 Cyclostationary Stochastic Processes.- A.6 A Glimpse of Markov Stochastic Processes.- References.

From the reviews of the first edition:

"This book is devoted to the research and estimation of the electrical noise generated by active semiconductor devices. It provides a thorough introduction to the physics-based numerical modeling of these devices operating both in small-signal and in large-signal conditions. ... this comprehensive treatment of the numerical simulation of noise in semiconductor devices successfully combines a modern physical understanding with rigorous mathematics and numerical methods. This book should be recommended to scientists and engineers of corresponding specialties ... ." (I. A. Parinov, Zentralblatt MATH, Vol. 1044 (19), 2004)

"Bonani and Ghione have written an excellent source book for research engineers and scientists interested in the modelling of noise in semiconductor devices. ... Compact noise models are derived from analytic models and numerical methods are presented to solve for the complex and realistic models. ... There is a useful and reasonably comprehensive bibliography. I strongly recommend this book to specialists in the area." (B. D. Nener, The Physicist, Vol. 39 (2), 2002)

Erscheint lt. Verlag	31.7.2001
Reihe/Serie	Springer Series in Advanced Microelectronics
Zusatzinfo	XXXI, 213 p. 22 illus.
Verlagsort	Berlin
Sprache	englisch
Maße	155 x 235 mm
Gewicht	474 g
Themenwelt	Technik ► Elektrotechnik / Energietechnik
Themenwelt	Technik ► Maschinenbau
Schlagworte	device numerical simultation • Halbleiterelektronik • Hardcover, Softcover / Physik, Astronomie/Elektrizität, Magnetismus, Optik • Hardcover, Softcover / Technik/Bautechnik, Umwelttechnik • HC/Physik, Astronomie/Elektrizität, Magnetismus, Optik • HC/Technik/Elektronik, Elektrotechnik, Nachrichtentechnik • Integrated circuit • Mikroelektronik • noise in linear circuits • noise in nonlinear circuits • noise in semiconductors • semiconductor • Semiconductor Devices
ISBN-10	3-540-66583-8 / 3540665838
ISBN-13	978-3-540-66583-0 / 9783540665830
Zustand	Neuware