Interconnect Noise Optimization in Nanometer Technologies - Mohamed Elgamel, Magdy A. Bayoumi

Interconnect Noise Optimization in Nanometer Technologies

Buch | Hardcover
137 Seiten
2005
Springer-Verlag New York Inc.
978-0-387-25870-6 (ISBN)
106,99 inkl. MwSt
Presents a range of CAD algorithms and techniques for synthesizing and optimizing interconnect. This title provides insight & intuition into layout analysis and optimization for interconnect in high speed, and high complexity integrated circuits.
Interconnect has become the dominating factor in determining system performance in nanometer technologies. Dedicated to this subject, Interconnect Noise Optimization in Nanometer Technologies provides insight and intuition into layout analysis and optimization for interconnect in high speed, high complexity integrated circuits.


The authors bring together a wealth of information presenting a range of CAD algorithms and techniques for synthesizing and optimizing interconnect. Practical aspects of the algorithms and the models are explained with sufficient details. The book investigates the most effective parameters in layout optimization. Different post-layout optimization techniques with complexity analysis and benchmarks tests are provided. The impact crosstalk noise and coupling on the wire delay is analyzed. Parameters that affect signal integrity are also considered.

Noise Analysis and Design in Deep Submicron.- Interconnect Noise Analysis and Optimization Techniques.- Crosstalk Noise Analysis in Ultra Deep Submicrometer Technologies.- Minimum Area Shield Insertion for Inductive Noise Reduction.- Spacing Algorithms for Crosstalk Noise Reduction.- Post Layout Interconnect Optimization for Crosscoupling Noise Reduction.- 3D Integration.- EDA Industry Tools: State of the ART.

Zusatzinfo XIX, 137 p.
Verlagsort New York, NY
Sprache englisch
Maße 155 x 235 mm
Themenwelt Informatik Weitere Themen CAD-Programme
Informatik Weitere Themen Hardware
Technik Elektrotechnik / Energietechnik
ISBN-10 0-387-25870-1 / 0387258701
ISBN-13 978-0-387-25870-6 / 9780387258706
Zustand Neuware
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