Noise in Semiconductor Devices
Springer Berlin (Verlag)
978-3-642-08586-4 (ISBN)
1. Noise in Semiconductor Devices.- 2. Noise Analysis Techniques.- 3. Physics-Based Small-Signal Noise Simulation.- 4. Results and Case Studies.- 5. Noise in Large-Signal Operation.- A. Appendix: Review of Probability Theory and Random Processes.- A.1 Fundamentals of Probability Theory.- A.2 Random Processes.- A.3 Correlation Spectra and Generalized Harmonic Analysis of Stochastic Processes.- A.4 Linear Transformations of Stochastic Processes.- A.5 Cyclostationary Stochastic Processes.- A.6 A Glimpse of Markov Stochastic Processes.- References.
From the reviews of the first edition:
"This book is devoted to the research and estimation of the electrical noise generated by active semiconductor devices. It provides a thorough introduction to the physics-based numerical modeling of these devices operating both in small-signal and in large-signal conditions. ... this comprehensive treatment of the numerical simulation of noise in semiconductor devices successfully combines a modern physical understanding with rigorous mathematics and numerical methods. This book should be recommended to scientists and engineers of corresponding specialties ... ." (I. A. Parinov, Zentralblatt MATH, Vol. 1044 (19), 2004)
"Bonani and Ghione have written an excellent source book for research engineers and scientists interested in the modelling of noise in semiconductor devices. ... Compact noise models are derived from analytic models and numerical methods are presented to solve for the complex and realistic models. ... There is a useful and reasonably comprehensive bibliography. I strongly recommend this book to specialists in the area." (B. D. Nener, The Physicist, Vol. 39 (2), 2002)
Erscheint lt. Verlag | 26.12.2012 |
---|---|
Reihe/Serie | Springer Series in Advanced Microelectronics |
Zusatzinfo | XXXI, 213 p. 22 illus. |
Verlagsort | Berlin |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 385 g |
Themenwelt | Technik ► Elektrotechnik / Energietechnik |
Technik ► Maschinenbau | |
Schlagworte | device numerical simultation • Integrated circuit • noise in linear circuits • noise in nonlinear circuits • noise in semiconductors • semiconductor • Semiconductor Devices |
ISBN-10 | 3-642-08586-5 / 3642085865 |
ISBN-13 | 978-3-642-08586-4 / 9783642085864 |
Zustand | Neuware |
Haben Sie eine Frage zum Produkt? |
aus dem Bereich