Next Generation HALT and HASS – Robust Design of Electronics and Systems

Kirk A. Gray, Accelerated Reliability Solutions, L.L.C., Colorado, USA Kirk Gray has over 33 years of experience in the electronics manufacturing industry. He began his career in electronics in semiconductor manufacturing equipment and progressing to validation and reliability testing at the system level. Starting in 1989 he worked closely with Gregg Hobbs Ph.D., the inventor of the methods of Highly Accelerated Life Test (HALT) and Highly Accelerated Stress Screening (HASS) at Storage Technology and later QualMark. He has been teaching, consulting, and applying HALT and HASS since 1992. He holds a Bachelor of Science in Electrical Engineering from the University of Texas at Austin and is a Senior Member of the IEEE. He was a past Chairperson of IEEE/CPMT Technical Committee on Accelerated Stress Testing and is a Senior Collaborator with the CALCE Consortium at The University of Maryland. He is the owner and Principal Consultant at Accelerated Reliability Solutions, LLC John J. Paschkewitz, Reliability Consultant, Missouri, USA John J. Paschkewitz has over 40 years' experience in product assurance, testing, reliability and sustaining engineering in several industries. He has been applying HALT and HASS since 1998. He holds a B.S. in Mechanical Engineering from the University of Wisconsin - Madison and a M.A. in Business Management from Central Michigan University. He is a registered Professional Engineer and ASQ Certified Reliability Engineer (CRE), a Senior Member of ASQ and a Member of SAE and ASME. He is now owner and Principal Consultant of Product Assurance Engineering, LLC.