Intermittent Failures in Integrated Circuits
Detection, Characterization and Fault Tolerance
Seiten
2016
|
2015 ed.
Springer-Verlag New York Inc.
978-1-4419-8314-5 (ISBN)
Springer-Verlag New York Inc.
978-1-4419-8314-5 (ISBN)
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Intermittent Failures in Integrated Circuits
This book presents a consolidated study of the entire class of intermittent failures by analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault tolerant design techniques at various layers of abstraction (from transistor to architecture) to improve reliability of system operation in presence of intermittent errors.
This book presents a consolidated study of the entire class of intermittent failures by analyzing the root causes behind these errors, their efficient detection and characterization, and finally fault tolerant design techniques at various layers of abstraction (from transistor to architecture) to improve reliability of system operation in presence of intermittent errors.
Fundamentals of VLSI Testing.- Circuit Marginality and Noise Sources.- Fault Modeling for Intermittent Errors.- Automatic Test Pattern Generation.- Design-for-Testability.- Test Economics and Cost-Benefit Analysis.- Layout Level Fault Tolerance.- Circuit Level Fault Tolerance.- Gate Level Fault Tolerance.- System Level Fault Tolerance.- Information Level Fault Tolerance.
| Erscheint lt. Verlag | 6.1.2016 |
|---|---|
| Zusatzinfo | biography |
| Verlagsort | New York, NY |
| Sprache | englisch |
| Themenwelt | Technik ► Elektrotechnik / Energietechnik |
| Technik ► Umwelttechnik / Biotechnologie | |
| ISBN-10 | 1-4419-8314-7 / 1441983147 |
| ISBN-13 | 978-1-4419-8314-5 / 9781441983145 |
| Zustand | Neuware |
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