Advances in X-Ray Analysis
Volume 35B
Seiten
2012
|
Softcover reprint of the original 1st ed. 1992
Springer-Verlag New York Inc.
978-1-4613-6532-7 (ISBN)
Springer-Verlag New York Inc.
978-1-4613-6532-7 (ISBN)
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
Zusatzinfo | IV, 641 p. |
---|---|
Verlagsort | New York, NY |
Sprache | englisch |
Maße | 170 x 244 mm |
Gewicht | 1100 g |
Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
Technik ► Elektrotechnik / Energietechnik | |
Technik ► Maschinenbau | |
ISBN-10 | 1-4613-6532-5 / 1461365325 |
ISBN-13 | 978-1-4613-6532-7 / 9781461365327 |
Zustand | Neuware |
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