Advances in X-Ray Analysis
Springer-Verlag New York Inc.
978-1-4613-6077-3 (ISBN)
I. Impact of Computers on X-ray Analysis.- II. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters.- III. Search/Match Methods, Phase Identification.- IV. Diffraction from Single Crystals and Epitaxial Films.- V. X-ray Characterization of Films and Surface Layers.- VI. Strain and Stress Determination, X-ray Fractography, Diffraction Peak Broadening Analysis.- VII. Advances in Detectors and Counting Electronics.- VIII. XRD Techniques and Instrumentation, Non-Ambient Applications, Texture, Other Applications.- IX. X-ray Optics, Monochromators and Synthetic Multilayers.- X. Total Reflection XRF Applications and Instrumentation, Other XRF Techniques and Instrumentation.- XI. Mathematical Techniques in X-ray Spectrometry.- XII. Geological and Other Applications of XRS.- Author Index.
Zusatzinfo | XXI, 756 p. |
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Verlagsort | New York, NY |
Sprache | englisch |
Maße | 178 x 254 mm |
Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
Technik ► Elektrotechnik / Energietechnik | |
Technik ► Maschinenbau | |
ISBN-10 | 1-4613-6077-3 / 1461360773 |
ISBN-13 | 978-1-4613-6077-3 / 9781461360773 |
Zustand | Neuware |
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