Advances in Imaging and Electron Physics
Academic Press Inc (Verlag)
978-0-12-014769-4 (ISBN)
The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.
The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Scanning Nonlinear Dielectric Microscopy; High Order Accurate Methods in Time-Domain Computational Electromagnetics; Pre filtering for Pattern Recognition Using Wavelet Transform and Neural Networks; Electron Optics and Electron Microscopy: Conference Proceedings and Abstracts as source Material.
| Erscheint lt. Verlag | 4.9.2003 |
|---|---|
| Reihe/Serie | Advances in Imaging and Electron Physics |
| Verlagsort | San Diego |
| Sprache | englisch |
| Maße | 152 x 229 mm |
| Gewicht | 680 g |
| Themenwelt | Technik ► Elektrotechnik / Energietechnik |
| ISBN-10 | 0-12-014769-6 / 0120147696 |
| ISBN-13 | 978-0-12-014769-4 / 9780120147694 |
| Zustand | Neuware |
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