Wire Bonding in Microelectronics: Materials, Processes, Reliability, and Yield - George Harman

Wire Bonding in Microelectronics: Materials, Processes, Reliability, and Yield

(Autor)

Buch | Hardcover
290 Seiten
1997 | 2nd edition
McGraw-Hill Professional (Verlag)
978-0-07-032619-4 (ISBN)
51,20 inkl. MwSt
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Wire bonds are used to interconnect integrated circuits, multichip modules and hybrids, and microwave as well as power devices to their packages. This is a reference on wire bonding. It emphasis on fine pitch bonding, bonding to MCMs, and additional areas.
This is the classic reference on wire bonding - expanded and updated! "Wire Bonding in Microelectronics Second Edition" the definitive single-volume reference on wire bonding just got better - in an extensively updated edition with over 100 new pages on new materials, new interconnect techniques such as fine pitch wire bonding, and evaluating the pros and cons of alternative bonding technologies. Wire bonds are used to interconnect integrated circuits, multichip modules and hybrids, and microwave as well as power devices to their packages. The book explains it all, with special emphasis on fine pitch bonding, bonding to MCMs, and additional areas that have been developed since the first edition was published.Readers will learn to: understand the bonding technology; test wire bonds; make reliable bonds at a very high yield; bond wires to multichip modules; solve common bonding problems; evaluate alternative bonding technologies; and, improve bondability and reliability via more effective cleaning techniques.

McGraw-Hill authors represent the leading experts in their fields and are dedicated to improving the lives, careers, and interests of readers worldwide

Technical Introduction to the Second Edition.Ultrasonic Bonding Systems and Technologies (Including Ultrasonic Wire Bonding Mechanism).Some Aspects of Bonding Wire Characteristics That can Affect Bonding, Reliability, or Testing.Wire Bond Testing.Gold-Aluminum Intermetallic Compounds and Other Metallic Interface Reactions Encountered in Wire Bonding.Bond Failures Resulting from Gold-Plating Impurities and Conditions.Cleaning to Improve Bondability and Reliability.Mechanical Problems in Wire Bonding.High-Yield and Fine-Pitch Wire Bonding.Wire Bonding to Multichip Modules and Other Soft Substrates.Glossary.Index.

Erscheint lt. Verlag 16.9.1997
Sprache englisch
Maße 158 x 231 mm
Gewicht 590 g
Themenwelt Technik Elektrotechnik / Energietechnik
ISBN-10 0-07-032619-3 / 0070326193
ISBN-13 978-0-07-032619-4 / 9780070326194
Zustand Neuware
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